Product keywords: solar cell energy loss, Voc loss, energy-loss, Voc loss, solar cell Voc loss, absolute luminescence quantum yield measurement system, solar cell open voltage (Voc) loss measurement instrument, loss of photon energy, thermodynamic loss, radiation loss, non-radiation loss
▌ Product introduction
HiYield-ENGL is used to measure the photon energy loss of photovoltaic devices such as solar cells (also known as solar cells). When testing the performance of solar cells, the sample needs to be irradiated with a standard solar simulation lamp [refer to our solar cell photovoltaic characteristics test system Sunshine]. Analog lights can provide AM0, AM1.5, AM1.5G and other standard spectrum of sunlight. Sunlight is polychromatic and contains photons of different frequency components. Photon energy E=ℎv, where ℎ is Planck's constant and v is the photon frequency. When the light of a photon energy ℎv1 irradiates a solar cell, theoretically, the maximum open circuit voltage of the solar cell at this time is the photon voltage (hv1/e,ℎ is the elementary charge). Solar cells are composed of semiconductor materials, which have abundant excited state energy level structures. In the actual work of solar cells, these rich energy level structures interact with complex-color sunlight, resulting in a variety of loss paths, and the actual open circuit voltage (Voc) is usually lower than the photon voltage. The lost photon energy Eloss =Eg −eVoc, and the lost open circuit voltage Vloss =Eg /e−Voc. The loss types can be divided into three categories: thermodynamic loss (ΔE1), radiation loss (ΔE2), and non-radiation loss (ΔE3). These loss types can be measured by HiYield-ENGL, which can reveal the inner workings of the solar cell and help developers optimize the solar cell process for higher VOCs and higher energy conversion efficiency (PCE).
Hiyield-engl is a member of the HiYield product family of Oriental Spectra (hereinafter referred to as 0S). Derived from OS's proven and acclaimed HiYield series, this instrument incorporates the concept of integrated design and integrates numerous high-precision functional modules into a compact body, which not only saves valuable laboratory space, but also significantly improves overall stability and productivity by reducing redundant connections between devices. HiYield-ENGL uses high-quality materials and processes, drawing on nearly 5 years of design and development and user experience of HiYield series products to ensure that users can quickly obtain stable and reliable measurement results.
HiYield-ENGL and HiYield-QFLS are sister products, both using OS's patented appearance structure, and together provide the industry with a complete test solution for quasi-Fermi level splitting and open circuit voltage loss.
▌ Product characteristics
□ Flexible modular design, can be suitable for various measurement scenarios;
□ Professional research-grade algorithm support, accurate PLQY data;
□ Compact machine, can be placed in the glove box for nitrogen atmosphere test;
□ Optional automatic sampling system, reduce human error, improve measurement repeatability;
□ Software automatic process operation, one-click measurement of all parameters.
▌ Function module
□ Electroluminescence quantum efficiency measurement (EL);
□ Photoluminescence quantum efficiency measurement (PL);
□ ΔE1: Thermodynamic loss module;
□ ΔE2: Radiation loss module;
□ ΔE3: non-radiation loss module;
□ Temperature measuring module.
▌ Technical parameter
Solar cell photon energy loss measuring instrument |
Model number | HiYield-ENGL |
Specification configuration | argument |
Feature | EL | Standard configuration |
PL | Standard configuration |
ΔE1：Thermodynamic loss module | Standard configuration |
ΔE2：Radiation loss module | Standard configuration |
ΔE3：Non-radiative loss module | Standard configuration |
Temperature measuring module | Standard configuration |
Wavelength range (optional) | 350-1050nm |
900-1700nm |
350-1700nm |
Wavelength resolution | 0.25 nm |
illuminant | Pina/NanoQ/Tuna/Stea series products are available |
Automatically test the number of device channels | 6 |
Current-voltage range | +/-10V, +/-150mA |
Current-voltage resolution | 10nA/1mV |
Maximum device area | 25mm*25mm |
Temperature range | 5-120℃ |
software | HiYield-ENGL software package |
