▌ Product introduction
HiYield-EL, an electroluminescent quantum efficiency measuring instrument, is an important member of the HiOE comprehensive luminescence measurement platform of Oriental Spectra Technology, which is used to accurately measure the luminescence characteristics of electroluminescent samples. The HiYield system can measure the depth of electroluminescence devices with first-class detection accuracy, and obtain comprehensive absolute electroluminescence efficiency parameters (quantum efficiency EQE, etc.) and related electrical, radiometric, photometric, colorimetric and other parameters. At the same time, the system integrates a stability test module, which can test the aging process of the device and obtain comprehensive information about the aging process of the device at the same time, that is, covering the above comprehensive parameters such as luminous efficiency, electricity, radiometry, photometry, colorimetry, etc. (The usual aging tester only tests current, voltage and relative brightness). Typical electroluminescent efficiency/quantum efficiency EQE, lifetime test, CIE, CRI, CCT, spectral response, spectral power distribution, IV, JV, total spectral radiant flux, radiant flux, luminous flux, luminous efficiency, spectral intensity, peak wavelength, FHWM, etc., are widely used in various types of electroluminescent device measurement.
▌ Test item
1. Absolute external quantum efficiency EQE;
2. Spectrum, spectral power distribution;
3.JV, IV;
4. Electrical parameters: voltage (V), current (I), current density (J), electric power (W), electric power density, etc.;
5. Radiometry: spectral power distribution, radiant flux, luminous flux, optical apparent efficiency, peak wavelength, main wavelength, etc.;
6. Colorimetry: CIE colorimetric coordinates, correlation color temperature (CCT), MK-1 (mred), color rendering index (CRI), RGB color values, etc.
