Search
English
  • 中文
  • English
  • 繁體中文

CONTACT US

If you have any queries, get in touch today! Don't hesitate. We try to take the extra step for our customer satisfaction.

  • SEND

  • Security Code
    Refresh the code
    Cancel
    Confirm

Time-of-Flight Mobility Measurement System FlYTOF

Equipment model: FlyTOF S300

Device features: The system uses time-of-flight (TOF) method to measure the mobility of semiconductor materials and related photoelectric characteristics, TOF method is considered to be the closest to the "real" mobility of a measurement method, carrier mobility measurement values covering 10^-9~10^6 cm^2/(V.s).

Open test: carrier mobility (electron mobility, hole mobility)

Equipment introduction Booking instructions Sample requirement Data presentation


▌ Product introduction


The system uses time-of-flight (TOF) method to measure the mobility of semiconductor materials and related photoelectric properties, and is widely used in various semiconductor materials. Such as silicon-based semiconductors, second-generation semiconductors, third-generation wide-band gap semiconductors, organic semiconductors, perovskite semiconductors, quantum dot semiconductors, two-dimensional materials semiconductors, metal-organic frameworks (MOF), covalent organic frameworks (COF), etc. FlyTOF is based on our MagicBox mainframe, equipped with convenient upper computer control and data measurement software, which can help customers to make fast and accurate measurements. FlyTOF is the source of research and development products of Oriental Spectra Technology, which first provided the industry with a built-up system in 2012, and launched the industry's first automated and integrated time-of-flight mobility measurement commercial equipment in 2019.




▌ Test item


1. Time-of-flight transient photocurrent measurement

2. Measurement of electronic mobility of semiconductor materials

3. Measurement of hole mobility of semiconductor materials







1. Equipment test conditions:

(1) Laser wavelength 337nm, 520nm;

(2) Open fixture;


2. It is recommended to communicate with engineers in advance about relevant test requirements:

(1) Chen Gong: 13809208932 (with wechat) Southern Region (Guangdong Province, Guangxi Zhuang Autonomous Region, Jiangxi Province, Fujian Province, Hainan Province, Hubei Province, Henan Province, Hunan Province, Yunnan Province, Guizhou Province, Chongqing Municipality, Sichuan Province, Tibet Autonomous Region, Hong Kong, Macao and Taiwan)

(2) Li Gong: 13922130970 (with wechat) Northern Region (Beijing, Tianjin, Hebei, Shanxi, Shandong, Liaoning, Jilin, Heilongjiang, Inner Mongolia Autonomous Region, Shanghai, Jiangsu, Zhejiang, Anhui, Shaanxi, Ningxia Hui Autonomous Region, Gansu, Qinghai, Xinjiang Uygur Autonomous Region)



Suitable sample


1. Organic semiconductors

2. Quantum dot semiconductor

3. Elemental semiconductors (Si, Ge, etc.)

4. Metal-organic Framework (MOF)

5. Two-dimensional materials

6. Wide-band gap third generation semiconductor

7. Perovskite materials

8. Compound semiconductors (InGaAs, etc.)

9. Covalent Organic Frame (COF)

10. Other semiconductor materials




Data presentation



No comment

Equipment introduction


▌ Product introduction


The system uses time-of-flight (TOF) method to measure the mobility of semiconductor materials and related photoelectric properties, and is widely used in various semiconductor materials. Such as silicon-based semiconductors, second-generation semiconductors, third-generation wide-band gap semiconductors, organic semiconductors, perovskite semiconductors, quantum dot semiconductors, two-dimensional materials semiconductors, metal-organic frameworks (MOF), covalent organic frameworks (COF), etc. FlyTOF is based on our MagicBox mainframe, equipped with convenient upper computer control and data measurement software, which can help customers to make fast and accurate measurements. FlyTOF is the source of research and development products of Oriental Spectra Technology, which first provided the industry with a built-up system in 2012, and launched the industry's first automated and integrated time-of-flight mobility measurement commercial equipment in 2019.




▌ Test item


1. Time-of-flight transient photocurrent measurement

2. Measurement of electronic mobility of semiconductor materials

3. Measurement of hole mobility of semiconductor materials






Booking instructions


1. Equipment test conditions:

(1) Laser wavelength 337nm, 520nm;

(2) Open fixture;


2. It is recommended to communicate with engineers in advance about relevant test requirements:

(1) Chen Gong: 13809208932 (with wechat) Southern Region (Guangdong Province, Guangxi Zhuang Autonomous Region, Jiangxi Province, Fujian Province, Hainan Province, Hubei Province, Henan Province, Hunan Province, Yunnan Province, Guizhou Province, Chongqing Municipality, Sichuan Province, Tibet Autonomous Region, Hong Kong, Macao and Taiwan)

(2) Li Gong: 13922130970 (with wechat) Northern Region (Beijing, Tianjin, Hebei, Shanxi, Shandong, Liaoning, Jilin, Heilongjiang, Inner Mongolia Autonomous Region, Shanghai, Jiangsu, Zhejiang, Anhui, Shaanxi, Ningxia Hui Autonomous Region, Gansu, Qinghai, Xinjiang Uygur Autonomous Region)


Sample requirement


Suitable sample


1. Organic semiconductors

2. Quantum dot semiconductor

3. Elemental semiconductors (Si, Ge, etc.)

4. Metal-organic Framework (MOF)

5. Two-dimensional materials

6. Wide-band gap third generation semiconductor

7. Perovskite materials

8. Compound semiconductors (InGaAs, etc.)

9. Covalent Organic Frame (COF)

10. Other semiconductor materials


Data presentation



Data presentation



Time-of-Flight Mobility Measurement System FlYTOF
Equipment model: FlyTOF S300

Device features: The system uses time-of-flight (TOF) method to measure the mobility of semiconductor materials and related photoelectric characteristics, TOF method is considered to be the closest to the "real" mobility of a measurement method, carrier mobility measurement values covering 10^-9~10^6 cm^2/(V.s).

Open test: carrier mobility (electron mobility, hole mobility)
Long press to look detail
Long by picture save/share
INQUIRY

enquiry form:

  • Please enter the verification code

Inquiry Content:


You have no items to require

Add Successfully

Time-of-Flight Mobility Measurement System FlYTOF

Book a test
INQUIRY

enquiry form:

  • Please enter the verification code

Inquiry Content:


You have no items to require

Add Successfully
图片展示
Search

Home  |  Products  | Laboratory  |  Solution  |  Contact Us 

Call:020-66834066                 

Email:info@orientalspectra.com

Add: Unit 303, Building 5, Changxing Chuangxing Port, No. 123 Baishashui Road, Tianhe District, Guangzhou

Copyright @ Oriental Spectra All Rights Reserved ICP filing number 18054769 Oriental Spectra Technology (Guangzhou) Co., Ltd.

Add WeChat friend to learn more about the product
Use Enterprise WeChat
"Scan" to join the group chat
Copy success!
Add WeChat friend to learn more about the product
I see.