Product Keywords: Electroluminescence, IVL, electroluminescence quantum efficiency, quantum efficiency, luminance, forward brightness, Angle resolution, device lifetime, external quantum efficiency, luminescence quantum Yield measurement system, absolute quantum efficiency, EQE, JV, IV, Absolute luminescence quantum Yield Measurement System, Autofocus, Lambert hypothesis, relative method, light distribution method, spectral power distribution ( λ), radiant flux, luminous flux, correlation color temperature (CCT), color rendering index (CRI), electric power density
▌ Product introduction
The electroluminescence measurement system NovaLum is an important member of the HiOE steady-state integrated photoelectric property measurement platform of Oriental Spectra Technology, which is used to accurately measure the performance of electroluminescence samples. The system includes IVL test, device life test, spatial Angle distribution test and other functions, which can easily and quickly obtain comprehensive performance parameters of electroluminescence devices, such as electroluminescence efficiency (current efficiency, power efficiency, external quantum efficiency, etc.), photometry, colorimetry, stability, luminescence Angle distribution and other related performance parameters. The equipment solves the problems in the industry: (1) when using the spectral radiometer test, there are low brightness test speed and high brightness over exposure, so it can not be used for the test of easily aging devices, and it is not suitable for the test of devices with a wide brightness range; (2) When using the integrating sphere system to test, it is impossible to get accurate forward brightness parameters, and there are overexposure problems at high brightness, and it is not possible to test high-luminescence samples.
▌ Product characteristics
□ Accurate brightness can be obtained, so it is suitable for OLED, perovskite LED, quantum dot LED, display and other surface light source measurement.
□ Equipped with automatic Angle resolution test function, you can quickly get the spatial distribution characteristics of the sample light.
□ Equipped with stability test function, aging test, with a wide brightness detection range (<1cd/m^2 ~999900 cd/m^2).
□ It can be tested in various environments, such as gas atmosphere, device non-package transfer test, etc., and can realize rapid sample change test in the glove box.
□ Equipped with automatic focus and observation, automatic displacement, automatic sub-device switching system, can greatly improve the test efficiency.
▌ Product function
□ Multiple scanning modes: voltage scanning, current scanning, Angle scanning, time scanning.
□ Segmented cycle current and voltage scanning: the hysteresis effect of the device can be studied.
□ Real-time measurement: real-time single point measurement, flexible judgment of the device working condition.
□ Two-wire/four-wire measurement: Four-wire measurement can more accurately measure the current and voltage of the device.
□ Automatic switching device: Select the measured sub-device through the software.
Automatic integration time: to avoid the problem of overexposure caused by too low brightness leading to no signal detection, or too high brightness.
□ Equipped with visual real-time observation and displacement system: the surface luminescence of the device can be observed in real time in the software, and the focus can be operated by the software.
□ Automatic data saving: Data is automatically saved during measurement to avoid data loss.
▌ Product application
□ Quantum dot light-emitting Diode (QLED)
□ Organic Light-emitting Diode (OLED)
□ Light Emitting Diode (LED)
□ Perovskite light-emitting Diode (PeLED)
□ Other types of electroluminescent devices
▌ Specification and model
Luminance measurement | Spectral measurement |
Brightness range | 0.01~9,999,000 cd/m^2 | Wavelength range | 200-850nm or 350-1000nm |
Test Angle | 1/3° | Integration time | 4 ms - 10 s |
Visual Angle | 9° | Dynamic range | 1300:1 |
Relative spectral sensitivity | Matching CIE spectral luminescence efficiency function V (λ) | Calibration linearity | >99.8% |
Minimum measuring area Ø | 4.5 mm (0.4mm) | Optical resolution | ~1.5 nm (FWHM) |
Minimum measuring distance | 1012mm (213mm) | Current and voltage measurement |
Measuring time | AUTO：0.7~4.3 s | Voltage range/resolution | -210V~210V/100nV |
MANUAL：0.7~7.1 s | Current range/resolution | -1.05A~1.05A/1pA |
▌ Test case
