Product Keywords: Multi-channel electroluminescence device Stability Test, Multi-channel electroluminescence device lifetime Test, electroluminescence, IVL, electroluminescence quantum efficiency, quantum efficiency, luminance, forward luminance, Angle resolution, device lifetime, external quantum efficiency, luminescence quantum Yield Measurement system, Multi-channel, electroluminescence device Aging System, Spectral Power distribution (λ), Spectral Power distribution (λ) λ), luminous flux, correlation color temperature (CCT), color rendering index (CRI), electric power density
▌ Product introduction
The multi-channel electroluminescence measurement system EL-Lab is an important member of the HiOE comprehensive luminescence measurement platform of Oriental Spectra Technology. Together with Oriental Spectra 's absolute electroluminescence measurement system HiYield, the multi-channel electroluminescence measurement system provides a complete electroluminescence measurement scheme for the industry.
The system consists of a series of corresponding distributed measurement components, including photoelectric measurement module, brightness calibration module, spectrum measurement module, etc. Based on the distribution characteristics of the system components, the measurement system can be flexibly constructed for different types of devices. The system can easily expand the number of measurement channels, and different test channels can be equipped with the same or different test functions, so that it can adapt to a variety of measurement scenarios, such as batch measurement, glove box measurement, variable temperature measurement, aging measurement.
▌ Product characteristics
□ Multi-channel batch measurement;
□ Can be put into the glove box test;
□ Support long-term aging test of multiple devices;
□ Support wide temperature range of variable temperature test;
□ Comprehensive electroluminescence measurement parameters.
About test channels: Different number of test channels and functions can be customized flexibly, such as:
■ Total test channels: 6
■ IVL test channels: 5
■ Spectrum test channel: 1
■ Aging (stability) test channels: 5
■ Variable temperature test channel: optional
▌ Product function
Luminous efficiency parameters: external quantum efficiency, current efficiency, power efficiency, etc.
□ Electrical parameters: voltage (V), current (I), current density (J), electric power density, etc.
□ Radiometric parameters: spectral power distribution, radiant flux, optical apparent efficiency, main wavelength, etc.
□ Photometric parameters: brightness, luminous flux, etc.
□ Colorimetric parameters: CIE colorimetric coordinates, correlation color temperature (CCT), MK-1, color rendering index, etc.
□ Device aging parameters: the above parameters under different aging times.
□ Temperature change measurement.
▌ Specification parameter
Photoelectric measurement module | Spectrum test module |
Wavelength range | 350-1100 nm | Wavelength range | 200-1100 nm |
Peak wavelength | 970 nm | Integration time | 3.8 ms – 10 s |
sensitivity | 0.725 A/W | Dynamic range | 3.4 x 10 ^6 (system); 1300:1 for a single acquisition |
Active area | 100 mm^2 | Stray light | <0.05% at 600 nm; <0.10% at 435 nm |
Rise/fall time | 65 ns(632 nm, RL=50Ω, 5V) | Optical resolution | ~1.5 nm(FWHM) |
Noise equivalent power | 2.07x10-13 W/√Hz（970 nm, 5 V） | Source table |
Dark current | 600 nA (Max. 5V) | argument |
Voltage range -20 V~20 V; Current range -120 mA~120 mA; Resolution 100 pA/0.1 mV
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Junction capacitance | 375 pF (Typ. 5V) |
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▌ Product application
□ Quantum dot light-emitting diode (QLED);
□ Organic light-emitting diode (OLED);
□ Light emitting diode (LED);
□ Perovskite light-emitting diode (PeLED);
□ Other types of electroluminescent devices.
