Product Keywords: Solar quasi Fermi level splitting, QFLS, implied voltage, iVoc, QFLS mapping, Absolute Luminescence quantum Yield Measurement System, quasi Fermi level, Fermi level, Quasi Fermi level splitting, External quantum Efficiency (EQE), PLQY, photoluminescence quantum efficiency, electroluminescence quantum efficiency, non-equilibrium carrier, non-equilibrium carrier, Pseudo JV
▌ Product introduction
Quasi-fermi level splitting tester HiYield-QFLS is used to test quasi-Fermi level splitting (QFLS) of photoelectric devices such as solar cells (also known as solar cells). QFLS refers to the generation of non-equilibrium charge carriers (electrons and holes) caused by light in a solar cell, resulting in the separation of the Fermi level of the electron and the Fermi level of the hole. This phenomenon is crucial for improving the performance of solar cells, as it helps to improve the open-circuit voltage and the overall energy conversion efficiency. Implied open circuit voltage (iVoc) can be obtained from QFLS, so HiYield-QFLS can also be called solar cell implied voltage tester. HiYield-QFLS integrates the functions of HiYield-EL, that is, contains the electroluminescence quantum efficiency test function. Hiyield-qfls is a member of the HiYield product family of OrientalSpectra (hereinafter referred to as 0S).
Currently, the HiYield product family includes: Electroluminescence quantum efficiency measuring instrument (HIYIEL-EL), ultra low electroluminescence measuring system (HiYield-EL-L), photoluminescence quantum efficiency measuring instrument (HiYield-PL), quasi-Fermi level splitting tester (HiYield-QFLS), solar cell loss analyzer (HiYield-ENGL), etc.
HiYield-QFLS is the first commercial quasi Fermi level splitting tester in China. Derived from OS's proven and acclaimed HiYield series, this instrument incorporates the concept of integrated design and integrates numerous high-precision functional modules into a compact body, which not only saves valuable laboratory space, but also significantly improves overall stability and productivity by reducing redundant connections between devices. Hiyield-qfls uses high-quality materials and processes, drawing on nearly 5 years of experience in the design, development and use of HiYield series products, to ensure that users can quickly obtain stable and reliable measurement results. Ease of operation is also a highlight of HiYield-QFLS. It is equipped with an intuitive operating interface that allows even users who are unfamiliar with the equipment to get started quickly, reducing training costs and time. Intelligent software support further simplifies the process of batch testing, data analysis and export, greatly improving work efficiency.
▌ Product characteristics
□ The industry's first full-function QFLS test equipment;
□ Rich, cutting-edge test function, integration of 6 modules, each module function also has a variety of rich test mode;
□ Turn-key system, with full Plug & Play characteristics;
□ Integrated design, with automation, highly integrated characteristics;
□ User-friendly design concept, low requirements for professional skills of operators;
□ Multiple sub-devices test switch by software, high test efficiency;
□ Integrated monitoring and observation module;
□ Integrated temperature measurement module.
▌ Product function
➢ Function Module
□ Electroluminescence Quantum Efficiency Measurement (EL)
□ Photoluminescence (Material) QFLS Test (QFLSPL)
□ Electroluminescence (devices) QFLS Test (QFLSEL)
□ QFLSEL Imaging Test (QFLsel-Mapping)
□ Pseudo-JV
□ Equivalent photovoltaic Characteristics Test (Equi-PV)
➢ Sub module function
□ Electroluminescence Quantum Efficiency Measurement Module (EL)
√ Measurement mode: a) Voltage scanning (including segmented scanning, cyclic scanning, etc.); b) constant pressure single point measurement; c) constant current single point measurement; d) Stability measurement: measurement under different aging time; e) Automatic measurement function with 6-channel sub-device.
√ Parameter category: a) Efficiency parameters (absolute extrajudicial quantum efficiency, current efficiency, power efficiency, etc.); b) Electrical parameters: voltage (V), current (I), current density (J), electric power (W), electric power density, etc.; c) Radiometry: spectral power distribution, radiant flux, luminous flux, optical apparent efficiency, peak wavelength, main wavelength, etc.; d) Colorimetry: CIE colorimetric coordinates, correlation color temperature (CCT), MK-1 (mred), color rendering index (CRI), RGB color values, etc. e) Stability test: aging parameters of the above parameters.
□ Photoluminescence (Material) QFLS Test (QFLSPL)
√ QFLSPL for single point irradiance
√ QFLSPL scanning at different irradiance
Electroluminescence (devices) QFLS Test (QFLSEL)
√ QFLSPL of single point current or voltage
√ QFLSPL scan with different current or voltage
□ QFLSEL Imaging Test (QFLsel-Mapping)
√ Single point current or voltage one-dimensional QFLSEL imaging test
√ One-dimensional QFLSEL imaging test with different current or voltage
√ Single point current or voltage 2D QFLSEL imaging test
√ 2D QFLSEL imaging test with different current or voltage
□ Pseudo-JV
Test the 532nm laser equivalent Pseudo-JV:
√ Different light intensity Voc automatic scanning test
√ Different light intensity JSC automatic scanning test
√ Pseudo-JV
□ Equivalent photovoltaic Characteristics Test (Equi-PV)
Using 532nm laser as irradiation source, the equivalent photovoltaic characteristics of the device were tested, and the parameters were as follows:
√ Short circuit current
√ Open circuit voltage
√ Fill factor
√ Energy conversion efficiency
√ Volt-ampere (JV) curve
√ Device ideality factor
▌ Product application
➢ Solar cells
□ Organic solar cells;
□ Perovskite solar cells;
□ Dye-sensitized solar cells;
□ Copper indium gallium selenium solar cells.
➢ Electroluminescent devices
□ Perovskite LED;
□ Organic light-emitting diode;
□ LED;
□ Quantum dot LED, etc.
➢ MOF (Metal-organic Framework)
➢ COF (Conjugate Organic Framework)
➢ Cadmium zinc telluride (CZT)
➢Mxenes
➢ Photocatalytic devices, etc.
▌ Technical parameter
HiYield-QFLS |
Feature | EL | Standard configuration |
QFLSPL | Standard configuration |
QFLSEL | Standard configuration |
QFLSEL-mapping | optional |
Pseudo-JV | Standard configuration |
Equi-PV | Standard configuration |
Monitoring and observation module | Standard configuration |
Temperature measuring module | Standard configuration |
Wavelength range (optional) | 350-1050nm |
900-1700nm |
350-1700nm |
Wavelength resolution | 0.25nm |
Irradiation source | Wave length | 532nm |
Equivalent light intensity | 0.001-11 SUNS |
Automatically test the number of device channels | 6 |
Current-voltage range | +/-10V, +/-150mA |
Current-voltage resolution | 10nA/1mV |
Mapping module | Resolution | 5um |
Maximum XY stroke | 10mm |
Maximum device area | 25mm*25mm |
Temperature range | 5-120℃ |
Software | HiYield-QFLS software package |
