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Full-Variable Space-Charge-Limited Current (SCLC) Mobility Measurement System EleSlope

Designed for SCLC-based mobility characterization, the EleSlope system enables trap density of states (DOS) analysis, carrier injection barrier evaluation, carrier mobility extraction, and trap effect investigation.

Full-Variable Space-Charge-Limited Current (SCLC) Mobility Measurement System EleSlope

Product Detail

Key Features

Supports in-situ temperature-dependent coupling with a glovebox

Enables fast sample exchange and testing within 1 minute

Supports temperature- and thickness-dependent SCLC analysis

Supports custom system configuration with current resolution down to 10 fA

Optional I-V simulation and analysis software


Specifications

Temperature range: 78 K – 350 K (varies depending on glovebox integration)

Electrical parameters: 200 V / 1 A, 10 fA / 100 nV

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Product Detail

Key Features

Supports in-situ temperature-dependent coupling with a glovebox

Enables fast sample exchange and testing within 1 minute

Supports temperature- and thickness-dependent SCLC analysis

Supports custom system configuration with current resolution down to 10 fA

Optional I-V simulation and analysis software


Specifications

Temperature range: 78 K – 350 K (varies depending on glovebox integration)

Electrical parameters: 200 V / 1 A, 10 fA / 100 nV

Full-Variable Space-Charge-Limited Current (SCLC) Mobility Measurement System EleSlope
Designed for SCLC-based mobility characterization, the EleSlope system enables trap density of states (DOS) analysis, carrier injection barrier evaluation, carrier mobility extraction, and trap effect investigation.
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