Product Keywords: Electroluminescence, IVL, electroluminescence quantum efficiency, quantum efficiency, luminance, forward luminance, Angle resolution, device lifetime, external quantum efficiency, luminescence quantum Yield measurement system, absolute quantum efficiency, EQE, JV, IV, Absolute luminescence quantum Yield Measurement System, CIE, color temperature, spectral power distribution λ, radiant flux, luminous flux, correlation color temperature (CCT), color rendering index (CRI), electric power density, integrating sphere
▌ Product introduction
HiYield-EL, an electroluminescent quantum efficiency measuring instrument, is an important member of the HiOE comprehensive luminescence measurement platform of Oriental Spectra Technology, which is used to accurately measure the luminescence characteristics of electroluminescent samples. The HiYield system can measure the depth of electroluminescence devices with first-class detection accuracy, and obtain comprehensive absolute electroluminescence efficiency parameters (quantum efficiency EQE, etc.) and related electrical, radiometric, photometric, colorimetric and other parameters. At the same time, the system integrates a stability test module, which can test the aging process of the device and obtain comprehensive information about the aging process of the device at the same time, that is, covering the above comprehensive parameters such as luminous efficiency, electricity, radiometry, photometry, colorimetry, etc. (The usual aging tester only tests current, voltage and relative brightness). Typical electroluminescent efficiency/quantum efficiency EQE, lifetime test, CIE, CRI, CCT, spectral response, spectral power distribution, IV, JV, total spectral radiant flux, radiant flux, luminous flux, luminous efficiency, spectral intensity, peak wavelength, FHWM, etc., are widely used in various types of electroluminescent device measurement.
▌ Product characteristics
□ It can measure the depth of electroluminescent devices with first-class detection accuracy, and obtain comprehensive absolute measurement of electroluminescent efficiency parameters (external quantum efficiency, etc.) and related electrical, radiometry, photometry, colorimetry and other parameters;
Integrated stability test module, can test the aging process of the device, and at the same time get the comprehensive information of the aging process of the device, that is, covers the above luminous efficiency, electricity, radiometry, photometry, colorimetry and other comprehensive parameters (usually aging tester, only current, voltage and relative brightness test);
□ The test process is controlled by software, easy to operate, charts and data are displayed in real time;
□ Can quickly and reliably track the test process of the sample;
□ With real-time measurement, predictive quantity, custom measurement, scanning measurement, time dependent measurement and other rich measurement modes.
▌ Product function
□ Efficiency parameters: luminous efficiency/external quantum efficiency EQE, current efficiency, power efficiency, etc.
□ Electrical parameters: voltage (V), current (I), current density (J), electric power (W), electric power density, etc.
□ Radiometry: spectral power distribution, radiant flux, luminous flux, optical apparent efficiency, peak wavelength, main wavelength, etc.
Colorimetry: CIE colorimetric coordinates, Correlation color temperature (CCT), MK-1 (mred), color rendering index (CRI), RGB color value, etc.
□ Stability test.
■ Includes measurement modes
√ Voltage scanning (including segmented scanning, cyclic scanning, etc.);
√ Current scanning (including segmented scanning, cyclic scanning, etc.);
√ Constant pressure single point measurement;
√ Constant current single point measurement;
√ Stability measurement: measurement at different aging times.
▌ Product application
□ Quantum dot light-emitting Diode (QLED)
□ Organic Light-emitting Diode (OLED)
□ Light Emitting Diode (LED)
□ Perovskite light-emitting Diode (PeLED)
□ Other types of electroluminescent devices, etc
▌ Specification and model
Absolute method electroluminescence characteristic measurement system |
series | HiYield-EL |
Spectrograph |
* Spectral range | 210-980nm | 225-1000nm | 350-1050nm | 900-1700nm |
probe | Refrigerated CCD |
System signal-to-noise ratio | 1000:1 |
A/D resolution | 16/18 bit |
Optical resolution | 0.14-7.7 nm FWHM |
Dynamic range | 85000 (Typical) |
Stray light | <0.08% at 600 nm;0.4% at 435 nm |
Sourcemeter |
Voltage range | -210V~210V |
Current range | -1.05A~1.05A |
* Resolution | 1pA / 100nV | 10fA-10nV |
Integrating sphere |
* Materials | Spectralon、PTFE、Spectraflect、BaSO4 |
* Inside Diameter | 3.3/6/10/15 inch Optional |
* Reflectivity | 400 to 1500 nm, greater than 99% | ＞97% | @600 nm 97-98% | ＞95% |
Software |
Measurement mode | voltage scanning (including segmented scanning, cyclic scanning, etc.); |
current scanning (including segmented scanning, cyclic scanning, etc.); |
constant pressure single point measurement; |
constant current single point measurement; |
Stability measurement: measured at different aging times. |
Functional parameter category | Efficiency parameters (external quantum efficiency, current efficiency, power efficiency, etc.); |
Electrical parameters: voltage (V), current (I), current density (J), electric power (W), electric power density, etc. |
radiometry: spectral power distribution, radiant flux, luminous flux, optical apparent efficiency, peak wavelength, main wavelength, etc. |
Colorimetry: CIE colorimetric coordinates, Correlation Color temperature (CCT), MK-1 (mred), Color Rendering index (CRI), RGB color values, etc. |
Stability test. |
Measuring fixture |
* Custom fixture | Design fixture according to customer sample package |
* The product or parameters can be flexibly configured according to customer requirements
▌ Product characteristics
